The International Electrotechnical Commission (IEC) releases draft standards Committee Drafts for Votes (CDV’s) that are open for public review and comment; contingent upon national policies and coordination with national standards bodies such as USNC/IEC. (The Secretariat for Technical Committee 56 is the United Kingdom). We curate this action for the user interest in the education industry and university-affiliated medical research and healthcare delivery enterprises here (Recent CDV’s from IEC).
Of particular interest to subject matter experts in several building technologies may be a recent release by IEC Technical Committee 56 Dependability. A “clean” version (i.e. a draft with strike-and-bold removed) of its dual-logo risk management document — IEC/ISO 31010 Risk management and risk assessment techniques — is now open for public comment. This, and other documents produced by the IEC and ISO should be regarded as templates for the development of national technical and business policy; hence our frequent reference to consensus standards as “regulatory products”.
Dependability — or reliability as it is understood in other technical disciplines — affects decisions about electrical power generation, fire safety, information technology, finance — to name a few. With so many stakeholders moving to meet the needs of economies that are growing, it is not unwise to at least be sensitive to the needs of other economies as reflected in the standards for dependable products and systems.
The CDV provides guidance on the selection and application of various techniques that can be used to help improve the way uncertainty is taken into account and to help understand risk. Comments are due February 16th.
Because access to this document is “coordinated” we refer this the IEEE Education & Healthcare Facilities Committee (which meets online again on Tuesday, January 30th) and we will also place this on the agenda of our Open Door teleconference this coming Wednesday, 11 AM Eastern time. Anyone is welcomed to join this teleconferences with the login information in this link (Click here)
Issue: [11-4]
Contact: Mike Anthony